Beam test of BTeV pixel detectors

J. C. Wang, J. A. Appel, M. Artuso, J. N. Butler, G. Cancelo, G. Cardoso, H. Cheung, G. Chiodini, D. C. Christian, A. Colautti, R. Coluccia, M. Di Corato, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, S. W. Kwan, A. Mekkaoui, D. MenasceC. Newsom, S. Sala, R. Yarema, S. Zimmermann

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