Average error probability analysis in mmWave cellular networks

Esma Turgut, Mustafa C Gursoy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

In this paper, a mathematical framework for the analysis of average symbol error probability (ASEP) in millimeter wave (mmWave) cellular networks with Poisson Point Process (PPP) distributed base stations (BSs) is developed using tools from stochastic geometry. The distinguishing features of mmWave communications such as directional beamforming and having different path loss laws for line-of-sight (LOS) and non-line-of-sight (NLOS) links are incorporated in the average error probability analysis. First, average pairwise error probability (APEP) expression is obtained by averaging pairwise error probability (PEP) over fading and random shortest distance from mobile user (MU) to its serving BS. Subsequently, average symbol error probability is approximated from APEP using the nearest neighbor (NN) approximation. ASEP is analyzed for different antenna gains and base station densities. Finally, the effect of beamforming alignment errors on ASEP is investigated to get insight on more realistic cases.

Original languageEnglish (US)
Title of host publication2015 IEEE 82nd Vehicular Technology Conference, VTC Fall 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479980918
DOIs
StatePublished - Jan 25 2016
Event82nd IEEE Vehicular Technology Conference, VTC Fall 2015 - Boston, United States
Duration: Sep 6 2015Sep 9 2015

Other

Other82nd IEEE Vehicular Technology Conference, VTC Fall 2015
CountryUnited States
CityBoston
Period9/6/159/9/15

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Automotive Engineering
  • Hardware and Architecture

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    Turgut, E., & Gursoy, M. C. (2016). Average error probability analysis in mmWave cellular networks. In 2015 IEEE 82nd Vehicular Technology Conference, VTC Fall 2015 - Proceedings [7390851] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCFall.2015.7390851