Application of vertex and mass constraints in track-based alignment

J. Amoraal, J. Blouw, S. Blusk, S. Borghi, M. Cattaneo, N. Chiapolini, G. Conti, M. Deissenroth, F. Dupertuis, R. Van Der Eijk, V. Fave, M. Gersabeck, A. Hicheur, W. Hulsbergen, D. Hutchcroft, A. Kozlinskiy, R. W. Lambert, F. MacIuc, R. Märki, M. MartinelliM. Merk, M. Needham, L. Nicolas, J. Palacios, C. Parkes, A. Pellegrino, S. Pozzi, G. Raven, E. Rodrigues, C. Salzmann, M. Schiller, O. Schneider, E. Simioni, O. Steinkamp, J. Van Tilburg, N. Tuning, U. Uwer, S. Vecchi, S. Viret

Research output: Contribution to journalArticle

22 Scopus citations

Abstract

The software alignment of planar tracking detectors using samples of charged particle trajectories may lead to global detector distortions that affect vertex and momentum resolution. We present an alignment procedure that constrains such distortions by making use of samples of decay vertices reconstructed from two or more trajectories and putting constraints on their invariant mass. We illustrate the method by using a sample of invariant-mass constrained vertices from D0K-π+ decays to remove a curvature bias in the LHCb spectrometer.

Original languageEnglish (US)
Pages (from-to)48-55
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume712
DOIs
StatePublished - Mar 25 2013

Keywords

  • Curvature bias
  • Detector alignment
  • Vertex fit

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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    Amoraal, J., Blouw, J., Blusk, S., Borghi, S., Cattaneo, M., Chiapolini, N., Conti, G., Deissenroth, M., Dupertuis, F., Van Der Eijk, R., Fave, V., Gersabeck, M., Hicheur, A., Hulsbergen, W., Hutchcroft, D., Kozlinskiy, A., Lambert, R. W., MacIuc, F., Märki, R., ... Viret, S. (2013). Application of vertex and mass constraints in track-based alignment. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 712, 48-55. https://doi.org/10.1016/j.nima.2012.11.192