TY - GEN
T1 - Analysis of radiation from printed circuits
AU - Sarkar, Tapan K.
N1 - Publisher Copyright:
© 1992 IEEE.
PY - 1992
Y1 - 1992
N2 - The objective of this presentation is to provide an overview of the mathematical techniques required to analyze arbitrary shaped printed circuits embedded in multiple lossy dielectric layers. The second objective is to present a novel deembedding technique to recover parameters of interest from numerical data.
AB - The objective of this presentation is to provide an overview of the mathematical techniques required to analyze arbitrary shaped printed circuits embedded in multiple lossy dielectric layers. The second objective is to present a novel deembedding technique to recover parameters of interest from numerical data.
UR - http://www.scopus.com/inward/record.url?scp=85068257539&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85068257539&partnerID=8YFLogxK
U2 - 10.1109/EPEP.1992.572300
DO - 10.1109/EPEP.1992.572300
M3 - Conference contribution
AN - SCOPUS:85068257539
T3 - Electrical Performance of Electronic Packaging, EPEP 1992
SP - 187
EP - 189
BT - Electrical Performance of Electronic Packaging, EPEP 1992
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1992 Electrical Performance of Electronic Packaging, EPEP 1992
Y2 - 22 April 1992 through 24 April 1992
ER -