An investigation of the delta-I noise on integrated circuits

Antonije R. Djordjevic; Tapan K. Sarkar

doi:10.1109/EPEP.1992.572277

An investigation of the delta-I noise on integrated circuits

Antonije R. Djordjevic, Tapan K. Sarkar

Department of Electrical Engineering & Computer Science

Research output: Chapter in Book/Entry/Poem › Conference contribution

Abstract

The delta-I noise is the phenomenon of the voltage induced between the power conductors (e.g. the ground and the V_cc planes) when a circuit connected between them switches from one state to another. This noise can endanger the performance of other circuits on the same chip or the printed board.

Original language	English (US)
Title of host publication	Electrical Performance of Electronic Packaging, EPEP 1992
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	102-103
Number of pages	2
ISBN (Electronic)	078030683X, 9780780306837
DOIs	https://doi.org/10.1109/EPEP.1992.572277
State	Published - 1992
Event	1992 Electrical Performance of Electronic Packaging, EPEP 1992 - Tucson, United States Duration: Apr 22 1992 → Apr 24 1992

Publication series

Name	Electrical Performance of Electronic Packaging, EPEP 1992

Conference

Conference	1992 Electrical Performance of Electronic Packaging, EPEP 1992
Country/Territory	United States
City	Tucson
Period	4/22/92 → 4/24/92

ASJC Scopus subject areas

Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/EPEP.1992.572277

Cite this

An investigation of the delta-I noise on integrated circuits. / Djordjevic, Antonije R.; Sarkar, Tapan K.
Electrical Performance of Electronic Packaging, EPEP 1992. Institute of Electrical and Electronics Engineers Inc., 1992. p. 102-103 572277 (Electrical Performance of Electronic Packaging, EPEP 1992).

Research output: Chapter in Book/Entry/Poem › Conference contribution

Djordjevic, AR & Sarkar, TK 1992, An investigation of the delta-I noise on integrated circuits. in Electrical Performance of Electronic Packaging, EPEP 1992., 572277, Electrical Performance of Electronic Packaging, EPEP 1992, Institute of Electrical and Electronics Engineers Inc., pp. 102-103, 1992 Electrical Performance of Electronic Packaging, EPEP 1992, Tucson, United States, 4/22/92. https://doi.org/10.1109/EPEP.1992.572277

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abstract = "The delta-I noise is the phenomenon of the voltage induced between the power conductors (e.g. the ground and the Vcc planes) when a circuit connected between them switches from one state to another. This noise can endanger the performance of other circuits on the same chip or the printed board.",

author = "Djordjevic, {Antonije R.} and Sarkar, {Tapan K.}",

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doi = "10.1109/EPEP.1992.572277",

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ER -

An investigation of the delta-I noise on integrated circuits

Abstract

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Conference

ASJC Scopus subject areas

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