An investigation of the delta-I noise on integrated circuits

Antonije R. Djordjevic, Tapan Kumar Sarkar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The delta-I noise is the phenomenon of the voltage induced between the power conductors (e.g. the ground and the Vcc planes) when a circuit connected between them switches from one state to another. This noise can endanger the performance of other circuits on the same chip or the printed board.

Original languageEnglish (US)
Title of host publicationElectrical Performance of Electronic Packaging, EPEP 1992
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages102-103
Number of pages2
ISBN (Electronic)078030683X, 9780780306837
DOIs
StatePublished - Jan 1 1992
Event1992 Electrical Performance of Electronic Packaging, EPEP 1992 - Tucson, United States
Duration: Apr 22 1992Apr 24 1992

Publication series

NameElectrical Performance of Electronic Packaging, EPEP 1992

Conference

Conference1992 Electrical Performance of Electronic Packaging, EPEP 1992
CountryUnited States
CityTucson
Period4/22/924/24/92

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

Cite this

Djordjevic, A. R., & Sarkar, T. K. (1992). An investigation of the delta-I noise on integrated circuits. In Electrical Performance of Electronic Packaging, EPEP 1992 (pp. 102-103). [572277] (Electrical Performance of Electronic Packaging, EPEP 1992). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEP.1992.572277