Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities

D. M. Trotter, Eric Allan Schiff

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)3529-3530
Number of pages2
JournalApplied Optics
Volume17
Issue number22
DOIs
StatePublished - Nov 15 1978
Externally publishedYes

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alignment
spectrometers
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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities. / Trotter, D. M.; Schiff, Eric Allan.

In: Applied Optics, Vol. 17, No. 22, 15.11.1978, p. 3529-3530.

Research output: Contribution to journalArticle

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