Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities

D. M. Trotter, Eric Allan Schiff

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)3529-3530
Number of pages2
JournalApplied Optics
Volume17
Issue number22
DOIs
StatePublished - Nov 15 1978
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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