TY - GEN
T1 - Adaptive scheduling and voltage sealing for multiprocessor real-time applications with non-deterministic workload
AU - Malani, Parth
AU - Mukre, Prakash
AU - Qiu, Qinru
AU - Wu, Qing
PY - 2008
Y1 - 2008
N2 - The computational workload of some real-time applications varies significantly during runtime, which makes the task scheduling and power management a challenge. One of the major influences to the workload of an application is the selection of conditional branches which may activate or deactivate a large set of operations. Focusing on real-time applications with variable workload which is due to random branch selection, this paper presents a framework of task mapping, scheduling and dynamic voltage and frequency scaling (DVFS) for a multiprocessor system. The proposed framework maintains workload awareness using dynamic profiling of branch probability. The profiled information is utilized by the scheduling and DVFS algorithm that are adopted in this framework to generate statistically optimal solution.
AB - The computational workload of some real-time applications varies significantly during runtime, which makes the task scheduling and power management a challenge. One of the major influences to the workload of an application is the selection of conditional branches which may activate or deactivate a large set of operations. Focusing on real-time applications with variable workload which is due to random branch selection, this paper presents a framework of task mapping, scheduling and dynamic voltage and frequency scaling (DVFS) for a multiprocessor system. The proposed framework maintains workload awareness using dynamic profiling of branch probability. The profiled information is utilized by the scheduling and DVFS algorithm that are adopted in this framework to generate statistically optimal solution.
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U2 - 10.1109/DATE.2008.4484751
DO - 10.1109/DATE.2008.4484751
M3 - Conference contribution
AN - SCOPUS:49749119977
SN - 9783981080
SN - 9789783981089
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 652
EP - 657
BT - Design, Automation and Test in Europe, DATE 2008
T2 - Design, Automation and Test in Europe, DATE 2008
Y2 - 10 March 2008 through 14 March 2008
ER -