TY - GEN
T1 - A probabilistic technique for full-chip leakage estimation
AU - Liu, Shaobo
AU - Qiu, Qinru
AU - Wu, Qing
PY - 2008
Y1 - 2008
N2 - In this paper, we propose a probability-based algorithm to estimate full-chip leakage without knowing layout information, under intra-die and inter-die process variations. Through modeling process variations into a random vector, we show that the standard cell leakage can be modeled as an inverse Gaussian random variable and further demonstrate that full-chip leakage can also be approximated to be an inverse Gaussian random variable. Hence, the leakage estimation problem is reduced to the estimation of the mean value and variance of the full-chip leakage. Experimental results show that the proposed algorithm is over 1000X faster than Monte Carlo simulation while the maximum estimation error is less than 6%.
AB - In this paper, we propose a probability-based algorithm to estimate full-chip leakage without knowing layout information, under intra-die and inter-die process variations. Through modeling process variations into a random vector, we show that the standard cell leakage can be modeled as an inverse Gaussian random variable and further demonstrate that full-chip leakage can also be approximated to be an inverse Gaussian random variable. Hence, the leakage estimation problem is reduced to the estimation of the mean value and variance of the full-chip leakage. Experimental results show that the proposed algorithm is over 1000X faster than Monte Carlo simulation while the maximum estimation error is less than 6%.
KW - Leakage estimation
KW - VLSI
UR - http://www.scopus.com/inward/record.url?scp=57649094597&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=57649094597&partnerID=8YFLogxK
U2 - 10.1145/1393921.1393975
DO - 10.1145/1393921.1393975
M3 - Conference contribution
AN - SCOPUS:57649094597
SN - 9781605581095
T3 - Proceedings of the International Symposium on Low Power Electronics and Design
SP - 205
EP - 208
BT - ISLPED'08
T2 - ISLPED'08: 13th ACM/IEEE International Symposium on Low Power Electronics and Design
Y2 - 11 August 2008 through 13 August 2008
ER -