A cross-layer framework for designing and optimizing deeply-scaled FinFET-based SRAM cells under process variations

Alireza Shafaei, Shuang Chen, Yanzhi Wang, Massoud Pedram

Research output: Chapter in Book/Entry/PoemConference contribution

8 Scopus citations

Fingerprint

Dive into the research topics of 'A cross-layer framework for designing and optimizing deeply-scaled FinFET-based SRAM cells under process variations'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science