7nm FinFET standard cell layout characterization and power density prediction in near- and super-threshold voltage regimes

Tiansong Cui, Qing Xie, Yanzhi Wang, Shahin Nazarian, Massoud Pedram

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

In this paper, we present a power density analysis for 7nm FinFET technology node, including both near-threshold and super-threshold operations. We first build a Liberty-formatted standard cell library by selecting the appropriate number of fins for the pull-up and pull-down networks of each logic cell. The layout of each cell then is characterized based on the lambda-based layout design rules for FinFET devices. Finally, the power density of the 7nm FinFET technology node is analyzed and compared with the state-of-the-art 45nm CMOS technology node for different circuits. Hspice results show that the power density of each 7nm FinFET circuit is at least 10 to 20 times larger than that of the same 45nm CMOS circuit in near- and super-threshold voltage regimes. Also the power densities of FinFET circuits are shown to be much higher than the limit of air cooling, which necessitates careful thermal management for the FinFET technology.

Original languageEnglish (US)
Title of host publication2014 International Green Computing Conference, IGCC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479961771
DOIs
StatePublished - Feb 10 2015
Event2014 International Green Computing Conference, IGCC 2014 - Dallas, United States
Duration: Nov 3 2014Nov 5 2014

Publication series

Name2014 International Green Computing Conference, IGCC 2014

Other

Other2014 International Green Computing Conference, IGCC 2014
CountryUnited States
CityDallas
Period11/3/1411/5/14

ASJC Scopus subject areas

  • Computer Science(all)
  • Renewable Energy, Sustainability and the Environment

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    Cui, T., Xie, Q., Wang, Y., Nazarian, S., & Pedram, M. (2015). 7nm FinFET standard cell layout characterization and power density prediction in near- and super-threshold voltage regimes. In 2014 International Green Computing Conference, IGCC 2014 [7039170] (2014 International Green Computing Conference, IGCC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IGCC.2014.7039170