Projects per year
Fingerprint Dive into the research topics where Uday Banerjee is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Finite element method
Engineering & Materials Science
Generalized Finite Element Method
Mathematics
finite element method
Physics & Astronomy
Numerical integration
Mathematics
Meshless Method
Mathematics
Finite Element Approximation
Mathematics
Finite Element Method
Mathematics
conditioning
Physics & Astronomy
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Projects 2006 2010
- 2 Finished
Simulating Our Complex World
National Science Foundation, University of Minnesota Duluth
9/1/10 → 11/30/10
Project: Research project
Collaborative Research: Generalized Finite Element Methods and Meshless Methods: Mathematical Analysis and Applications
7/1/06 → 6/30/10
Project: Research project
Research Output 1986 2019
- 726 Citations
- 13 h-Index
- 26 Article
Strongly Stable Generalized Finite Element Method (SSGFEM) for a non-smooth interface problem
Zhang, Q., Banerjee, U. & Babuška, I., Feb 1 2019, In : Computer Methods in Applied Mechanics and Engineering. 344, p. 538-568 31 p.Research output: Contribution to journal › Article
finite element method
Finite element method
conditioning
Interfaces (computer)
mesh
7
Citations
(Scopus)
Strongly stable generalized finite element method: Application to interface problems
Babuška, I., Banerjee, U. & Kergrene, K., 2017, (Accepted/In press) In : Computer Methods in Applied Mechanics and Engineering.Research output: Contribution to journal › Article
Interfaces (computer)
finite element method
Finite element method
axioms
Convergence of numerical methods
5
Citations
(Scopus)
Robustness in stable generalized finite element methods (SGFEM) applied to Poisson problems with crack singularities
Zhang, Q., Babuška, I. & Banerjee, U., Nov 1 2016, In : Computer Methods in Applied Mechanics and Engineering. 311, p. 476-502 27 p.Research output: Contribution to journal › Article
finite element method
cracks
Cracks
Finite element method
conditioning
16
Citations
(Scopus)
Stable Generalized Finite Element Method and associated iterative schemes; application to interface problems
Kergrene, K., Babuška, I. & Banerjee, U., Jun 15 2016, In : Computer Methods in Applied Mechanics and Engineering. 305, p. 1-36 36 p.Research output: Contribution to journal › Article
Interfaces (computer)
finite element method
Finite element method
conditioning
mesh
48
Citations
(Scopus)
Stable GFEM (SGFEM): Improved conditioning and accuracy of GFEM/XFEM for three-dimensional fracture mechanics
Gupta, V., Duarte, C. A., Babuška, I. & Banerjee, U., Jun 1 2015, In : Computer Methods in Applied Mechanics and Engineering. 289, p. 355-386 32 p.Research output: Contribution to journal › Article
fracture mechanics
conditioning
Fracture mechanics
Finite element method
Stress intensity factors
Press and Media
June 15, 2017: Syracuse University: Bookstore Closed for Year-End Inventory
Uday Banerjee, Joanna O Masingila, William Wylie, Patrick Penfield & Jack E Graver
6/17/17
2 items of Media coverage
Press/Media: Expert Comment
June 13, 2017: Syracuse University: Don't Fall For a Student Employment Scam
Cathryn R Newton, Uday Banerjee, Joanna O Masingila, William Wylie & Jack E Graver
6/14/17 → 6/15/17
7 items of media coverage
Press/Media: Expert Comment
June 14, 2017: Syracuse University: Ten Tons of Love Donation Reaches Fourteen Tons
Uday Banerjee, Joanna O Masingila, William Wylie, Cathryn R Newton & Jack E Graver
6/15/17
4 items of media coverage
Press/Media: Expert Comment
MATHEMATICIAN AWARDED NSF CAREER GRANT
Uday Banerjee, Jack E Graver, Joanna O Masingila & William Wylie
6/14/17
1 item of media coverage
Press/Media: Expert Comment
May 26, 2017: Syracuse University: Memorial Day Means Remembrance and Reflection
Uday Banerjee, Derek X Seward, Leonid V. Kovalev, Fiona Chew, Cathryn R Newton, Tadeusz Iwaniec, Mark Monmonier & Jani Kristian Onninen
5/27/17
2 items of media coverage
Press/Media: Expert Comment