• 969 Citations
  • 20 h-Index
1985 …2018

Research output per year

If you made any changes in Pure these will be visible here soon.

Network

John A. Glass

  • Syracuse University
  • Center for Science and Technology
  • General Electric
  • W. M. Keck Ctr. Molec. Electronics
  • Department of Chemistry and Center for Molecular Electronics

External person

P. A. Dowben

  • Syracuse University
  • University of Nebraska
  • Center for Molecular Electronics
  • Ctr. for Mat. Research and Analysis
  • Department of Physics and Astronomy
  • Center for Materials Research and Analysis
  • University of Nebraska-Lincoln

External person

Shreyas S. Kher

  • Syracuse University
  • Center for Science and Technology
  • Center for Molecular Electronics
  • Department of Chemistry and Center for Molecular Electronics

External person

Pei Ma

  • Syracuse University
  • Foundation Medicine Inc
  • Department of Chemistry and the Forensic and National Security Sciences Institute (FNSSI)
  • AstraZeneca
  • Department of Chemistry and the Forensic
  • Forensic and National Security Sciences Institute and Department of Chemistry
  • Foundation Medicine Inc

External person

Seong Don Hwang

  • Syracuse University
  • University of Nebraska
  • Department of Physics and Astronomy
  • Ctr. for Mat. Research and Analysis
  • Solid State Science and Technology Program
  • Department of Physics and Astronomy
  • Center for Materials Research and Analysis
  • University of Nebraska-Lincoln

External person

R. N. Grimes

  • University of Virginia
  • Department of Chemistry

External person

Bruce H. Goodreau

  • Syracuse University
  • Henkel Corporation, USA
  • Department of Chemistry and Center for Molecular Electronics
  • Henkel KGaA

External person

Jesse Taylor

  • Syracuse University

External person

Adam P. Hitchcock

  • Lawrence Berkeley National Laboratory
  • McMaster University
  • Department of Chemistry

External person

R. W. Miller

  • Syracuse University
  • Department of Chemistry and Center for Molecular Electronics
  • Center for Science and Technology

External person

Lianna R. Orlando

  • Syracuse University
  • National Science Foundation
  • Department of Chemistry and Center for Molecular Electronics

External person

Sunwoo Lee

  • Syracuse University
  • Solid State Science and Technology Program

External person

Ralf Littger

  • Syracuse University
  • Department of Chemistry and the Forensic and National Security Sciences Institute (FNSSI)
  • Dept. Chem./W. M. Keck Ctr. M.E.

External person

Damian G. Allis

  • Syracuse University
  • Nanorex, Inc
  • National Institute of Standards and Technology
  • Department of Chemistry and the Forensic and National Security Sciences Institute (FNSSI)
  • Dapartment of Chemistry
  • Dept. Chem. W.M. Keck Ctr. Molec. E.

External person

Alex T. Wen

  • McMaster University
  • Department of Chemistry

External person

Yong Feng Hu

  • Western University
  • Department of Chemistry

External person

G. M. Bancroft

  • Western University
  • Department of Chemistry

External person

Thomas Whelan

  • Syracuse University
  • SUNY Albany
  • University of Virginia
  • Department of Chemistry
  • Department of Chemistry
  • Department of Chemistry
  • SUNY Potsdam

External person

Mohammad R. Pourian

  • University of Virginia
  • Department of Chemistry

External person

Dongjin Byun

  • Syracuse University
  • University of Nebraska
  • Ctr. for Mat. Research and Analysis
  • Solid State Science and Technology Program
  • Center for Materials Research and Analysis
  • University of Nebraska-Lincoln

External person

H. P. Abicht

  • Martin Luther University Halle-Wittenberg
  • Iowa State University
  • Department of Chemistry

External person

J. Caruso

  • Syracuse University

External person

Ekk Sinn

  • University of Virginia
  • Department of Chemistry

External person

David N. McIlroy

  • Ctr. for Mat. Research and Analysis
  • University of Nebraska-Lincoln

External person

J. G. Verkade

  • Iowa State University
  • Department of Chemistry

External person

Ray J. Butcher

  • Howard University

External person

Brian Robertson

  • University of Nebraska
  • Department of Mechanical Engineering
  • Center for Materials Research and Analysis
  • University of Nebraska-Lincoln

External person

Christopher R. Petrelli

  • Syracuse University

External person

C. W. Hutchings

  • Syracuse University
  • University of Nebraska
  • Laboratory of Surface and Low Temperature Physics
  • Department of Physics and Astronomy
  • University of Nebraska-Lincoln

External person

Yexin Tan

  • Syracuse University

External person

Kelley J. Donaghy

  • Department of Chemistry and Center for Molecular Electronics
  • Syracuse University
  • Center for Science and Technology

External person

Mark E. Fessler

  • University of Virginia
  • Department of Chemistry

External person

McLoed, T.

  • Syracuse University

External person

Jennifer L. O’Loughlin

  • Syracuse University

External person

Anvith Mahabalagiri

  • Syracuse University
  • Electrical Engineering and Computer Science Department

External person

Joseph F. Lomax

  • University of Virginia
  • Department of Chemistry

External person

Tiffany M. Smith Pellizzeri

  • Syracuse University
  • Department of Chemistry and the Forensic and National Security Sciences Institute (FNSSI)

External person

Tolek Tyliszczak

  • McMaster University
  • Department of Chemistry

External person

Dongqi Li

  • Syracuse University

External person

Peter T. Meinke

  • Syracuse University

External person

R. W. Millert

  • Syracuse University
  • Center for Molecular Electronics

External person

Steve Hersee

  • General Electric

External person

Sweder, K. S.

  • Syracuse University

External person

Craig M. Davis

  • Center for Science and Technology

External person

A. J. Goodby

  • Science Research Institute
  • Division of Chemical Sciences

External person

N. M. Boag

  • Science Research Institute
  • Division of Chemical Sciences

External person

Robert L. Ostrander

  • Syracuse University
  • Department of Chemistry and Center for Molecular Electronics

External person

Ana Torvisco

  • Syracuse University

External person

D. Zych

  • SUNY Albany
  • Department of Physics
  • SUNY Oswego

External person

Alan G. Goos

  • University of Texas at El Paso
  • Syracuse University
  • Department of Physics

External person

James Ballingall

  • General Electric

External person

Jennifer V. Romero

  • Syracuse University

External person

A. L. David Kilcoyne

  • McMaster University
  • Department of Chemistry

External person

Grant A. Krafft

  • Syracuse University

External person

John D. Bozek

  • Lawrence Berkeley National Laboratory

External person

John Mazurowski

  • General Electric

External person

Istvén Pelczer

  • Syracuse University
  • NIH Resource for NMR and Data Processing
  • Princeton University
  • Chemistry Department

External person

Khadeer, A.

  • Syracuse University

External person

J. Zhang

  • University of Michigan, Ann Arbor
  • Syracuse University
  • University of Massachusetts
  • University of Nebraska
  • University of Minnesota Duluth
  • Kansas State University
  • Argonne National Laboratory
  • University of Minnesota Twin Cities
  • High Energy Physics Division
  • Ctr. for Mat. Research and Analysis
  • University of Nebraska-Lincoln
  • Argonne National Laboratory

External person

Jian Ma

  • University of Wisconsin-Madison
  • Department of Physics

External person

A. Newlon

  • Syracuse University

External person

Albert Chin

  • General Electric

External person

Eckart Rühl

  • Johannes Gutenberg University Mainz
  • Universität Mainz
  • Institut für Physik

External person

Pellizzeri, Tiffany M.Smith

  • Department of Chemistry and Center for Optical Materials Science and Engineering Technologies (COMSET)
  • Department of Chemistry and the Forensic and National Security Sciences Institute (FNSSI)
  • Clemson University
  • Syracuse University

External person

Wilda Vargas

  • Syracuse University

External person

S. Bialyt

  • Syracuse University
  • Center for Molecular Electronics

External person

F. Keith Perkins

  • University of Wisconsin-Madison
  • University of Nebraska
  • Department of Physics
  • University of Nebraska-Lincoln
  • Microwave Technology Branch
  • Naval Research Laboratory
  • Syracuse University

External person

G. T. Stauf

  • Syracuse University
  • Center for Molecular Electronics

External person

P. A. Dowbent

  • Syracuse University
  • Center for Molecular Electronics

External person

Schlereth, F. H.

  • Syracuse University

External person

Nobuhiro Kosugi

  • National Institutes of Natural Sciences
  • National Institutes of Natural Sciences - Institute for Molecular Science

External person

A. Cheeseman

  • University of Nebraska
  • University of Nebraska-Lincoln

External person

Paul Martin

  • General Electric

External person

J. Kushneir

  • Syracuse University
  • Center for Molecular Electronics

External person

G. T. Stauft

  • Syracuse University
  • Center for Molecular Electronics
  • Naval Research Laboratory

External person

Gary J. Long

  • Missouri University of Science and Technology
  • Department of Chemistry

External person

Yoon Git Kirnt

  • Syracuse University
  • Center for Molecular Electronics

External person

A. Patwa

  • Stony Brook University
  • SUNY Albany
  • Brookhaven National Laboratory
  • Department of Physics
  • SUNY Oswego

External person

G. O. Ramseyer

  • General Electric
  • Electronics Laboratory

External person

Stephen G. Urquhart

  • McMaster University
  • Department of Chemistry

External person

Bailey Fitzgerald

  • Syracuse University

External person

Tiffany M. Smith

  • Syracuse University
  • Department of Chemistry and the Forensic

External person

Erin Rent

  • Syracuse University

External person

Yoon Gi Kim

  • Syracuse University
  • Center for Molecular Electronics

External person

M. Onellion

  • University of Nebraska
  • University of Wisconsin-Madison
  • Ctr. for Mat. Research and Analysis
  • Department of Physics
  • University of Nebraska-Lincoln
  • Syracuse University

External person

Gheorghe Anitescu

  • University of Bucharest
  • Syracuse University
  • Department of Chemical Engineering and Materials Science
  • Department of Physical Chemistry
  • Department of Biomedical and Chemical Engineering
  • National Institute of Standards and Technology
  • Thermophysical Properties Division
  • University of Colorado Boulder
  • Chem. Eng. and Mat. Sci. Department
  • Department of Biochemical and Chemical Engineering

External person

Susan B. Sinnott

  • University of Kentucky
  • Dept. of Mat. Sci. and Engineering
  • Iowa State University
  • University of Florida

External person