A low-voltage transmission electron microscope (TEM; LVEM5, Delong Americas) is capable of examining samples at the nanoscale, including thin sections or films, nanoparticles, and nanofibers. It utilizes a 5 kV Schottky field emission electron source for very high brightness and spatial coherency, providing ultra-high contrast on a variety of hard and soft nanomaterials.
|Name||Transmission Electron Microscope|
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