Equipments Details
Description
A scanning electron microscope (SEM; JSM5600, JEOL) fitted with an energy dispersive spectroscopy (EDS; Princeton Gammatech) system allows for imaging of surface structures at the micro-scale and surface elemental analysis.
Details
| Name | JSM 5600 Scanning Electron Microscope (SEM) |
|---|---|
| Acquisition date | 1/1/99 |
| Manufacturers | JEOL Ltd. |
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