Scanning Electron Microscope (SEM)

    Eric B. Finkelstein (Manager)

Equipment/facility: Equipment

  • Location

    Bowne Hall

    United States

Equipments Details

Description

A scanning electron microscope (SEM; JSM5600, JEOL) fitted with an energy dispersive spectroscopy (EDS; Princeton Gammatech) system allows for imaging of surface structures at the micro-scale and surface elemental analysis.

Details

NameJSM 5600 Scanning Electron Microscope (SEM)
Acquisition date1/1/99
ManufacturersJEOL Ltd.

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