Atomic Force Microscope (AFM)

    Eric B. Finkelstein (Manager)

Equipment/facility: Equipment

  • Location

    Bowne Hall

    United States

Equipments Details

Description

An atomic force microscope (AFM; Nanoscope IIIa, Multimode, Bruker) has a standard “J” scanner capable of scanning a 100 µm x 100 µm area and an “E” scanner capable of scanning a 10 µm x 10 µm area to facilitate high-resolution imaging of nano-structures to nearly atomic levels.

The AFM is capable of operating in contact and tapping mode, and has fluid cells for examining wet samples.
Photo associated with equipment

Details

NameNanoscope IIIa, Multimode AFM
Acquisition date1/1/99
ManufacturersVeeco Instruments Inc.

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