Atomic Force Microscope (AFM)

  • Eric B. Finkelstein (Manager)

Equipment/facility: Equipment

Equipments Details


An atomic force microscope (AFM; Nanoscope IIIa, Multimode, Bruker) has a standard “J” scanner capable of scanning a 100 µm x 100 µm area and an “E” scanner capable of scanning a 10 µm x 10 µm area to facilitate high-resolution imaging of nano-structures to nearly atomic levels.

The AFM is capable of operating in contact and tapping mode, and has fluid cells for examining wet samples.


NameNanoscope IIIa, Multimode AFM
Acquisition date1/1/99
ManufacturersVeeco Instruments Inc.


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