Atomic Force Microscope (AFM)

An atomic force microscope (AFM; Nanoscope IIIa, Multimode, Bruker) has a standard “J” scanner capable of scanning a 100 µm x 100 µm area and an “E” scanner capable of scanning a 10 µm x 10 µm area to facilitate high-resolution imaging of nano-structures to nearly atomic levels.

The AFM is capable of operating in contact and tapping mode, and has fluid cells for examining wet samples.